DocumentCode
2437792
Title
Test in the era of "What you see is not what you get" - Keynote address
Author
Koenemann, B.
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
12
Lastpage
12
Abstract
Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Keywords
Design engineering; Engineering management; Failure analysis; Manufacturing processes; Process design; Semiconductor device manufacture; Semiconductor device testing; Software debugging; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Conference_Location
Charlotte, NC, USA
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1386929
Filename
1386929
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