Title :
Error exponents in multiple hypothesis testing for arbitrarily varying sources
Author :
Grigoryan, Naira M. ; Harutyunyan, Ashot N.
fDate :
Aug. 30 2010-Sept. 3 2010
Abstract :
The problem of multiple hypothesis testing (HT) for arbitrarily varying sources (AVS) is considered. The achievable error probability exponents (reliabilities) region is derived, optimal decision schemes are described. The result extends the known ones by Fu and Shen and by Tuncel. The Chernoff bounds for AVS binary and M-ary HT are specified via indication of a Sanov theorem for those sources.
Keywords :
probability; statistical testing; AVS binary; Chernoff bounds; M-ary HT; achievable error probability exponents; arbitrarily varying sources; error exponents; multiple hypothesis testing; optimal decision schemes; Computer aided software engineering; Error probability; Information theory; Reliability theory; Testing; Tin; Upper bound;
Conference_Titel :
Information Theory Workshop (ITW), 2010 IEEE
Conference_Location :
Dublin
Print_ISBN :
978-1-4244-8262-7
Electronic_ISBN :
978-1-4244-8263-4
DOI :
10.1109/CIG.2010.5592740
