Title :
Detecting faults in the peripheral circuits and an evaluation of SRAM tests
Author :
Van de Goor, Ad J. ; Hamdioui, Said ; Wadsworth, Rob
Author_Institution :
Comput. Eng. Lab., Delft Univ. of Technol., Netherlands
Abstract :
Very little has been published on faults in the memory peripheral circuits, denoted as ´PFs´. This work shows that PFs are detected by March tests, provided that they satisfy particular properties, expressed in terms of properties of the algorithm, and of properties of the algorithm stress. The latter consists of the used data backgrounds and addressing directions. The detection capabilities of a set of well-known March algorithms are established for the PFs. In addition, industrial results from applying this set of tests to a large number of 0.13 micron 512 Kbyte SRAM chips, combined with a variety of stress conditions, are presented.
Keywords :
SRAM chips; fault diagnosis; integrated circuit testing; 0.13 micron; 512 Kbyte; March algorithms; March test; SRAM chips; SRAM test; fault detection; memory peripheral circuits; Circuit faults; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Random access memory; SRAM chips; Semiconductor device testing; Stress; Voltage;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386943
