Title :
Post-Silicon Validation and Calibration of Hardware Security Primitives
Author :
Xiaolin Xu ; Suresh, Vikram ; Kumar, Ravindra ; Burleson, Wayne
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
Abstract :
Physical Unclonable Functions (PUFs) and True Random Number Generators (TRNGs) are gaining significant importance in the field of hardware security. These crypto-graphic primitives harness randomness from IC fabrication process and on-chip noise respectively, necessitating unconventional post-Silicon (Si) validation techniques. In this work, we present a brief survey of post-Si validation techniques for PUFs and TRNGs, highlighting the importance of testing PUFs resilience against novel attacks and monitoring bias in TRNGs. We also propose novel techniques for monitoring PUFs reliability and measuring bias in TRNGs. The proposed techniques do not only facilitate on-chip calibration for hardware security systems, but can also be used as a countermeasure against fault-attacks.
Keywords :
calibration; cryptography; integrated circuit manufacture; integrated circuit noise; integrated circuit reliability; integrated circuit testing; random number generation; IC fabrication process; cryptographic primitives harness randomness; hardware security primitives; on-chip calibration; on-chip noise; physical unclonable functions; post-silicon validation; reliability; true random number generators; Circuit faults; Delays; Integrated circuit reliability; Monitoring; Security; Temperature sensors; Hardware Security; Physical Unclonable Functions; Post-silicon Validation Calibration; True Random Number Generators;
Conference_Titel :
VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4799-3763-9
DOI :
10.1109/ISVLSI.2014.80