• DocumentCode
    2438266
  • Title

    ATE data collection - a comprehensive requirements proposal to maximize ROI of test

  • Author

    Rehani, Manu ; Abercrombie, David ; Madge, Robert ; Teisher, Jim ; Saw, Jason

  • Author_Institution
    LSI Logic Corp., Milpitas, CA, USA
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    181
  • Lastpage
    189
  • Abstract
    ATE customers are increasingly viewing a tester that does not facilitate easy and consistent access to the test data as a barrier to their profitability. The data is needed towards various ends like, statistical post processing (SPP) for die binning, reliability improvement, burn-in elimination, process/yield improvement, adaptive control, product characterization, test floor statistical process control (SPC), calibration & test repeatability to name a few. subcontractor & foundry manufacturing have only increased the complexity of the task. The main premise of This work is that: "Taking the measurement" is the ATE vendor\´s expertise, "Evaluating the measurement" is the customer\´s expertise and we have a proposal to clear the confusion and maximize the ROI of test. The paper discusses the current "state-of-the-art " in terms of data collection, illustrates the windfall of benefits reaped from utilizing the ATE data and presents a proposal on how to improve the situation.
  • Keywords
    automatic test equipment; ATE customers; ATE data collection; ATE vendor; ROI maximization; adaptive control; burn-in elimination; die binning; measurement evaluation; process yield improvement; product characterization; profitability; reliability; state of the art technology; statistical post processing; test floor statistical process control; Adaptive control; Automatic testing; Calibration; Large scale integration; Logic testing; Process control; Profitability; Proposals; Statistical analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1386951
  • Filename
    1386951