Title :
Divide and conquer based Fast Shmoo algorithms
Author_Institution :
Syst. on a Chip Bus. Unit, Agilent Technol., Germany
Abstract :
Shmoo-plots are a powerful characterization technique in digital IC testing. Utilization and number of ICs exposed are limited by high execution times. This work presents an effective Fast-Shmoo algorithm to accelerate device characterization. The robust optimization concept is adapted to specific device characterization needs and reduce test execution times significantly.
Keywords :
circuit optimisation; digital integrated circuits; divide and conquer methods; integrated circuit testing; Fast Shmoo algorithms; Shmoo plots; device characterization; digital IC testing; divide and conquer algorithms; optimization; time reduction; Area measurement; Coordinate measuring machines; Digital integrated circuits; Error analysis; Integrated circuit testing; Life estimation; Performance evaluation; Random access memory; Semiconductor device measurement; Shape measurement;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386953
