DocumentCode
2438311
Title
Application of silicon diode for temperature measurements in strong microwave fields
Author
Afonin, D.G. ; Kanunov, Ye.R.
Author_Institution
Phys. Dept., Moscow State Univ., Russia
fYear
2003
fDate
8-12 Sept. 2003
Firstpage
485
Lastpage
486
Abstract
This paper discusses the application of silicon diode in the research of EM distribution and temperature measurements in strong microwave fields. Advantages of using silicon diodes for these purposes are outlined.
Keywords
electromagnetic fields; microwave measurement; semiconductor diodes; temperature measurement; temperature sensors; EM distribution; microwave field; silicon diode; temperature measurement; Diodes; Electromagnetic measurements; IEEE catalog; Microwave measurements; Organizing; Silicon; Space technology; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2003. CriMiCo 2003. 13th International Crimean Conference
Conference_Location
Sevastopol, Crimea, Ukraine
Print_ISBN
966-7968-26-X
Type
conf
DOI
10.1109/CRMICO.2003.158905
Filename
1256590
Link To Document