DocumentCode
2438523
Title
Extending the digital core-based test methodology to support mixed-signal
Author
Seuren, Geert ; Waayers, Tom
Author_Institution
Philips Res. Electron. Design & Tools, Eindhoven, Netherlands
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
281
Lastpage
289
Abstract
This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was realized and experiments show clear advantages.
Keywords
design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; DFT; digital core based test architecture; mixed signal cores testing; system-on-chip; test library; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic testing; Modems; Signal design; Software libraries; System testing; System-on-a-chip; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1386962
Filename
1386962
Link To Document