Title :
Extending the digital core-based test methodology to support mixed-signal
Author :
Seuren, Geert ; Waayers, Tom
Author_Institution :
Philips Res. Electron. Design & Tools, Eindhoven, Netherlands
Abstract :
This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was realized and experiments show clear advantages.
Keywords :
design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; DFT; digital core based test architecture; mixed signal cores testing; system-on-chip; test library; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic testing; Modems; Signal design; Software libraries; System testing; System-on-a-chip; Time to market;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386962
