DocumentCode :
2438647
Title :
Novel adaptive power gating strategy of TSV-based multi-layer 3D IC
Author :
Seungwon Kim ; Seokhyung Kang ; Ki Jin Han ; Youngmin Kim
Author_Institution :
Ulsan Nat. Inst. of Sci. & Technol. (UNIST), Ulsan, South Korea
fYear :
2015
fDate :
2-4 March 2015
Firstpage :
537
Lastpage :
541
Abstract :
Among power dissipation components, the leakage power has become more dominant with each successive technology node. A power gating technique has been widely used to reduce the standby leakage energy. In this work, we investigate the power gating strategy of TSV-based 3D IC stacking structures. Power gating control is becoming more complicated as more dies are stacked. We combine the on-chip PDN and TSV in a multilayered 3D IC for a power gating analysis of the static and dynamic voltage drops and in-rush current. Then, we propose a novel power gating strategy that optimizes the inrush current profile, subject to the voltage-drop constraints. Our power gating strategy provides a minimal wake-up latency such that the voltage noise safety margins are not violated. In addition, the layer dependency of the 3D IC on the power gating in terms of the wake-up time reduction is analyzed. We achieve an average wake-up time reduction of 28% for all cases with our adaptive power gating method that exploits location (or layer) information of the aggressors in a 3D IC.
Keywords :
electric potential; power control; three-dimensional integrated circuits; adaptive power gating control strategy; die stacking; in-rush current profile optimization; layer dependency; leakage power; location information; minimal wake-up latency; multilayer 3D IC stacking structure; on-chip PDN; on-chip TSV; power delivery network; power dissipation components; standby leakage energy reduction; static-dynamic voltage drop constraints; successive technology node; through-silicon-via; voltage noise safety margins; wake-up time reduction; Integrated circuit modeling; Metals; Noise; Solid modeling; Three-dimensional displays; Through-silicon vias; 3D IC; Power Gating; Through-Silicon Vias (TSVs) Power Delivery Network (PDN); Wake-up Time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
Type :
conf
DOI :
10.1109/ISQED.2015.7085483
Filename :
7085483
Link To Document :
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