• DocumentCode
    2438647
  • Title

    Novel adaptive power gating strategy of TSV-based multi-layer 3D IC

  • Author

    Seungwon Kim ; Seokhyung Kang ; Ki Jin Han ; Youngmin Kim

  • Author_Institution
    Ulsan Nat. Inst. of Sci. & Technol. (UNIST), Ulsan, South Korea
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    537
  • Lastpage
    541
  • Abstract
    Among power dissipation components, the leakage power has become more dominant with each successive technology node. A power gating technique has been widely used to reduce the standby leakage energy. In this work, we investigate the power gating strategy of TSV-based 3D IC stacking structures. Power gating control is becoming more complicated as more dies are stacked. We combine the on-chip PDN and TSV in a multilayered 3D IC for a power gating analysis of the static and dynamic voltage drops and in-rush current. Then, we propose a novel power gating strategy that optimizes the inrush current profile, subject to the voltage-drop constraints. Our power gating strategy provides a minimal wake-up latency such that the voltage noise safety margins are not violated. In addition, the layer dependency of the 3D IC on the power gating in terms of the wake-up time reduction is analyzed. We achieve an average wake-up time reduction of 28% for all cases with our adaptive power gating method that exploits location (or layer) information of the aggressors in a 3D IC.
  • Keywords
    electric potential; power control; three-dimensional integrated circuits; adaptive power gating control strategy; die stacking; in-rush current profile optimization; layer dependency; leakage power; location information; minimal wake-up latency; multilayer 3D IC stacking structure; on-chip PDN; on-chip TSV; power delivery network; power dissipation components; standby leakage energy reduction; static-dynamic voltage drop constraints; successive technology node; through-silicon-via; voltage noise safety margins; wake-up time reduction; Integrated circuit modeling; Metals; Noise; Solid modeling; Three-dimensional displays; Through-silicon vias; 3D IC; Power Gating; Through-Silicon Vias (TSVs) Power Delivery Network (PDN); Wake-up Time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085483
  • Filename
    7085483