Title :
A new probing technique for high-speed/high-density printed circuit boards
Author :
Parker, Kenneth P.
Author_Institution :
Agilent Technol., Loveland, CO, USA
Abstract :
Bullock in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of these rules stand in good stead even today. However, recent technical advances in operational board speed are leading some to believe that in-circuit testing cannot be performed on the high-speed sectors of boards soon to be designed. Due to the increasing usage of high-speed circuitry, there is worry in our industry that in-circuit testing is marginalized with no good substitute available. It is the purpose of This work to show how access can be maintained, even on highly dense gigabit logic boards.
Keywords :
design for testability; printed circuit testing; DFT rules; design for test; gigabit logic boards; high density printed circuit boards; high speed circuitry; high speed printed circuit boards; in-circuit testing; probing technique; Circuit testing; Design for testability; Fixtures; Logic testing; Performance evaluation; Pins; Printed circuits; Probes; Resistors; Switches;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386972
