• DocumentCode
    2438724
  • Title

    Metrics for measurement of additive noise to weight in sigmoidal FFANNs

  • Author

    Singh, Amit Prakash ; Rai, C.S. ; Chandra, Pravin

  • Author_Institution
    Univ. Sch. of Inf. Technol., GGS Indraprastha Univ., Delhi, India
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    2197
  • Lastpage
    2201
  • Abstract
    Feedforward artificial neural networks are susceptible to thermal noise when implemented as analog or digital hardware. Thus to study of the effect of noise on neural hardware, noise metrics have to be identified. In this paper, five new metrics are prepared and shown to be relevant for noise modeling in the neural hardware.
  • Keywords
    feedforward neural nets; integrated circuit noise; neural chips; noise measurement; additive noise measurement; analog hardware; digital hardware; feedforward artificial neural network; neural hardware; noise effect; noise metrics; noise modeling; sigmoidal FFANN; thermal noise; Artificial neural networks; Fault tolerance; Fault tolerant systems; Hardware; Measurement; Noise; Training; Fault Metric; Feedforward Neural Network; Weight Noise; fault tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Automation Robotics & Vision (ICARCV), 2010 11th International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-7814-9
  • Type

    conf

  • DOI
    10.1109/ICARCV.2010.5707883
  • Filename
    5707883