Title :
Test strategy cost model innovations
Author :
Michel, Carlos ; Reinosa, Rosa D.
Author_Institution :
Hewlett-Packard Co., Guadalajara, Mexico
Abstract :
The selection of an adequate set of test and inspection techniques to verify the quality and functionality of a product, as well as, the integrity of the manufacturing process can be a complex task. This selection process normally require a detailed technical assessment on the effectiveness of each test technique, trade-off analysis among alternate test techniques/platforms and an economic evaluation of the various options available. In industry today, there are many methodologies utilized to derive the return-on-investment (ROI) analysis of a particular manufacturing test strategy. The test strategy cost model of the National Electronics Manufacturing Initiative, Inc. (NEMI) completed, in April 2003, has been enhanced based on the feedback received from users of the model and on experiences of the authors when applying this model to analyze current product test strategies.
Keywords :
costing; inspection; investment; manufacturing processes; printed circuit testing; production testing; National Electronics Manufacturing Initiative; cost model innovations; inspection techniques; manufacturing process; manufacturing test strategy; product test strategies; return on investment analysis; test strategy cost model; trade off analysis; Costs; Electronic equipment testing; Electronics packaging; Feedback; Inspection; Manufacturing processes; Milling machines; Principal component analysis; Surface-mount technology; Technological innovation;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386974
