• DocumentCode
    2438896
  • Title

    Emittance growth during bunch compression of intense particle beams

  • Author

    Kinoshita, S. ; Kobayashi, M. ; Nakajima, M. ; Horioka, K.

  • Author_Institution
    Dept. of Energy Sci., Tokyo Inst. of Technol., Yokohama
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. In high-energy ion accelerator, bunch compression using a longitudinal beam modulation is essential to increase the beam power. However, the bunching process is inevitably accompanied by emittance growth, because of a space charge effect, inaccurate bunching voltage, fluctuation in the beam transport line and others. To simulate the bunching process in high power ion accelerator, we constructed a small accelerator composed of an electron beam injector, induction voltage modulators and a beam transport line with 2 m in length, in which an electron beam is accelerated, longitudinally modulated, and trasported for bunching. Evolutions of the beam emittance are estimated by pepper-pot images of the bunched beam. We discuss the compressive effect including the correlation between transverse and longitudinal emittance, as a function of the beam current, the transport length, and the bunching factor.
  • Keywords
    ion accelerators; particle beam bunching; particle beam diagnostics; particle beam injection; beam transport line; bunch compression; electron beam injector; emittance growth; high-energy ion accelerator; induction voltage modulators; intense particle beams; longitudinal beam modulation; pepper-pot images; size 2 m; space charge effect; Acceleration; Electron accelerators; Electron beams; Intensity modulation; Ion accelerators; Optical modulation; Particle beams; Space charge; Space technology; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
  • Conference_Location
    Karlsruhe
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-1929-6
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2008.4590869
  • Filename
    4590869