DocumentCode
243890
Title
A More Accurate Outage Analysis for ZF-Based MIMO AF Two-Way Relaying by Order Statistics
Author
Rongsheng Li ; Tiejun Lv ; Hui Gao
Author_Institution
Key Lab. of Trustworthy Distrib. Comput. & Service, Beijing Univ. of Posts & Telecommun., Beijing, China
fYear
2014
fDate
18-21 May 2014
Firstpage
1
Lastpage
5
Abstract
In this paper, a more accurate outage performance analysis is obtained by employing order statistics for multiple-input multiple-out two-way relay system with joint transmit/receive zero-forcing. Furthermore, closed-form upper and lower bounds are first derived for the overall outage probability when there exist spatial correlations at the relay. Analysis and simulation results indicate that the upper bound derived with order statistics is tight under various spatial correlations at the relay, and it is also tighter than that derived by eigenvalues of Wishart matrices over independent identically distributed Rayleigh fading channel. For example, when the relay is equipped with 4, 6 and 8 antennas, the upper bounds derived with order statistics are 2dB, 3dB and 4dB tighter than those with eigenvalues, respectively. In particular, when the numbers of antennas equipped at the users are greater than that equipped at the relay, the derived upper bound is nearly identical to the exact results.
Keywords
MIMO communication; Rayleigh channels; antenna arrays; eigenvalues and eigenfunctions; higher order statistics; matrix algebra; probability; relay networks (telecommunication); Wishart matrices; ZF-based MIMO AF two-way relaying outage analysis; antennas; closed-form upper bounds; eigenvalues; higher order statistics; independent identically distributed Rayleigh fading channel; joint transmit-receive zero-forcing; lower bounds; multiple-input multiple-out two-way relay system; outage performance analysis; outage probability; spatial correlations; Fading; Joints; MIMO; Probability; Relays; Signal to noise ratio; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference (VTC Spring), 2014 IEEE 79th
Conference_Location
Seoul
Type
conf
DOI
10.1109/VTCSpring.2014.7022782
Filename
7022782
Link To Document