DocumentCode :
2438931
Title :
Application of fault diagnosis based on signed digraphs and PCA with linear fault boundary
Author :
Shin, Bong-Su ; Lee, Chang Jun ; Lee, Gibaek ; Yoon, En Sup
Author_Institution :
Seoul Nat. Univ., Seoul
fYear :
2007
fDate :
17-20 Oct. 2007
Firstpage :
984
Lastpage :
987
Abstract :
In this paper, we developed a fault diagnosis model based on signed digraph(SDG), support vector machine(SVM) and improved principal component analysis(PCA) method. In PCA, we set linear fault boundaries. By means of the system decomposition based on SDG, the local models of each measured variable are constructed and more accurate and fast models are using an SVM, which has no loss of information and shows good performance, in order to obtain the estimated value of the variable, which is then compared with the measured value in order to diagnose the fault. And then, in order to make fault boundaries linearized, we select particular variables in the local model and express the data through the PC space. In the last analysis for various fault intensities, we diagnose a number of faulty data effectively. To verify the performance of the proposed model, the Tennessee Eastman(TE) Process was studied and the proposed method was found to demonstrate a good diagnosis capability compared with previous statistical methods.
Keywords :
directed graphs; failure analysis; fault diagnosis; principal component analysis; process monitoring; quality control; support vector machines; Tennessee Eastman process monitoring; fault diagnosis model; principal component analysis; quality control; signed digraph; support vector machine; Biological system modeling; Chemical analysis; Chemical engineering; Electronic mail; Fault diagnosis; Loss measurement; Predictive models; Principal component analysis; Statistical learning; Support vector machines; PCA; fault diagnosis; fault intensity; linear fault boundary; signed digraph; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control, Automation and Systems, 2007. ICCAS '07. International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-89-950038-6-2
Electronic_ISBN :
978-89-950038-6-2
Type :
conf
DOI :
10.1109/ICCAS.2007.4407067
Filename :
4407067
Link To Document :
بازگشت