Title :
CAEN-BIST: testing the nanofabric
Author :
Brown, Jason G. ; Blanton, R.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
A built-in self-test algorithm is developed for chemically-assembled electronic nanotechnology (CAEN) that exploits reconfigurability to achieve 100% fault coverage and nearly 100% diagnostic accuracy. This algorithm is particularly suited for regular architectures with high defect densities.
Keywords :
built-in self test; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; nanoelectronics; built-in self test algorithm; chemically assembled electronic nanotechnology; fault coverage; fault diagnostic accuracy; field programmable gate arrays; high defect densities; nanofabrication; reconfigurability; regular architectures; Built-in self-test; Circuit testing; Fault diagnosis; Field programmable gate arrays; Logic arrays; Logic devices; Manufacturing; Nanoscale devices; Nanotechnology; Programmable logic arrays;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386982
