Title :
Routability and fault tolerance of FPGA interconnect architectures
Author :
Huang, Jing ; Tahoori, Mehdi B. ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
This work presents a new approach for the evaluation of FPGA routing resources in the presence of interconnect faults. All possible interconnect faults for programmable switches and wiring channels are considered. Signal routing in the presence of faulty interconnect resources is analyzed at both switch block and the entire FPGA. Two new probabilistic routing (routability) metrics are proposed and used as figures of merit for evaluating the interconnect resources of commercially available FPGAs as well as academic architectures.
Keywords :
fault tolerance; field programmable gate arrays; integrated circuit interconnections; logic testing; network routing; FPGA interconnect architectures; FPGA routing resources; fault tolerance; faulty interconnect resources; interconnect faults; probabilistic routing metrics; programmable switches; routability; signal routing; wiring channels; Circuit faults; Computer architecture; Fault detection; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Routing; Switches; Wiring;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386984