Title :
The stability of C60 and its derivatives upon handling in microsystems technologies
Author :
Klocek, Jolanta ; Friedrich, Daniel ; Schmeisser, Dieter ; Hecker, Michael ; Zschech, Ehrenfried
Author_Institution :
Dept. of Appl. Phys. & Sensors, Brandenburg Univ. of Technol., Cottbus, Germany
Abstract :
We investigate C60, C60(OH)24, C60(F3)12, C60Cl2 and analyse the stability of these derivatives upon processing in sol-gel, spin-coating, spraying, dropping and evaporating procedures to obtain thin films for possible microsystems application. We use X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, Near Edge X-ray Absorption Fine Structure Spectroscopy (NEXAFS) to analyse the fullerene species within the films. We find fullerene molecules stable in evaporation procedure but not stable in films obtained by using fullerenes dissolved in toluene, chlorobenzene and cyclohexane. Most stable are the evaporated films of pure C60, while the soluble derivatives are less stable. The fluorine derivatives are most stable when processed by spray coating with ethanol as a solvent. Fullerol was dissolved in H2O and films are obtained by spray coating.
Keywords :
EXAFS; Fourier transform spectra; Raman spectra; X-ray photoelectron spectra; XANES; dissolving; fullerene compounds; fullerenes; infrared spectra; micromechanical devices; sol-gel processing; spin coating; spray coatings; thin films; vacuum deposition; C60; C60(F3)12; C60(OH)24; C60C12; FTIR; Fourier transform infrared spectroscopy; NEXAFS; Raman spectroscopy; X-ray photoelectron spectroscopy; XPS; chlorobenzene; cyclohexane; dissolving; dropping; ethanol; evaporation; fluorine derivatives; fullerene molecules; fullerene species; fullerol; microsystem technology; near edge X-ray absorption fine structure spectroscopy; sol-gel processing; spin coating; spray coating; spraying; thin films; toluene; Coatings; Electromagnetic wave absorption; Ethanol; Fourier transforms; Infrared spectra; Raman scattering; Spectroscopy; Spraying; Stability analysis; Transistors;
Conference_Titel :
Students and Young Scientists Workshop "Photonics and Microsystems", 2009 International
Conference_Location :
Wernigerode
Print_ISBN :
978-1-4244-4304-8
DOI :
10.1109/STYSW.2009.5470307