DocumentCode :
2439008
Title :
Z-DFD: design-for-diagnosability based on the concept of Z-detection
Author :
Pomeranz, Irith ; Venkataraman, Srikanth ; Reddy, Sudhakar M.
Author_Institution :
Sch. of ECE, Purdue Univ., West Lafayette, IN, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
489
Lastpage :
497
Abstract :
We address the problem of design-for-diagnosability, i.e., improving the accuracy of fault diagnosis or reducing its complexity through the insertion of observation points. To perform design-for-diagnosability efficiently, we use a procedure developed earlier for computing the number of fault pairs, NP, that are not guaranteed to be distinguished by a given test set. By using the concept of z -detection, NP can be computed efficiently without enumerating fault pairs and without performing non-fault dropping fault simulation. We study the possibility of increasing the diagnosability of a circuit by inserting observation points so as to reduce NP. Our results include the following. (1) We find experimentally the number of observation points that need to be inserted in order to achieve a close-to-minimum value for NP. (2) We describe an efficient procedure for inserting a given number of observation points so as to reduce NP. We present experimental results for benchmark circuits to demonstrate the accuracy of using NP to guide a design-for-diagnosability process.
Keywords :
benchmark testing; circuit complexity; circuit simulation; combinational circuits; design for testability; fault simulation; logic design; logic testing; benchmark circuits; circuit complexity; combinational circuits; design for diagnosability; fault diagnosis; fault pairs; fault simulation; observation points; z -detection; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Performance evaluation; Process design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1386985
Filename :
1386985
Link To Document :
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