DocumentCode :
2439035
Title :
A comparative study on photon recycling effects in n+-p and p+-n InP solar cells with Bragg reflector
Author :
Yamamoto, A. ; Kurizuka, M. ; Murshid, Md.M. ; Hashimoto, A.
Author_Institution :
Fac. of Eng., Fukui Univ., Japan
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
903
Lastpage :
906
Abstract :
Numerical calculation of photon recycling (PR) effect has been carried out for n+-p and p+-n structure InP cells with Bragg reflector (BR). For both structures with a thin (≲ 0.1 μm) emitter, PR effects on photocurrent are scarcely observed. A large contribution of PR to photocurrent is found for an n+-p structure with a thick (≳0.5 μm) emitter although photocurrent itself is reduced. A p+-n structure with a similar configuration, on the other hand, shows very small PR effects. Such a difference in the magnitude of PR effects between both cell structures is brought by the difference in radiative and nonradiative lifetimes between n+ and p+ emitters. An increase in Voc is found for an n+-p cell with a thin (~2 μm) base layer. As results of increases in photocurrent and Voc by PR, conversion efficiency of a n+-p cell is increased by about 3%. For both cell structures, PR effects are observed for a base thickness less than about 3 μm. The effects are not due to the trapping of re-emitted light but the trapping of incident light
Keywords :
III-V semiconductors; carrier lifetime; indium compounds; photoconductivity; solar cells; Bragg reflector; InP; conversion efficiency increase; incident light trapping; n+-p InP solar cells; nonradiative lifetimes; numerical calculation; p+-n InP solar cells; photocurrent; photon recycling effects; radiative lifetimes; thick emitter; thin emitter; Doping; Electron traps; Indium phosphide; Photoconductivity; Photonic band gap; Photovoltaic cells; Radiative recombination; Recycling; Solar power generation; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654233
Filename :
654233
Link To Document :
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