DocumentCode
2439042
Title
Fault diagnosis in designs with convolutional compactors
Author
Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen
Author_Institution
Mentor Graphics Corp., Beaverton, OR, USA
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
498
Lastpage
507
Abstract
The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. The proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction.
Keywords
boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; built-in self test; convolutional compactors; convolutional test response compaction; failing scan cells; integrated circuit testing; nonadaptive fault diagnosis technique; scan based designs; time efficient identification; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Fault diagnosis; Graphics; Logic devices; Registers; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1386986
Filename
1386986
Link To Document