• DocumentCode
    243914
  • Title

    FinCACTI: Architectural Analysis and Modeling of Caches with Deeply-Scaled FinFET Devices

  • Author

    Shafaei, Alireza ; Yanzhi Wang ; Xue Lin ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2014
  • fDate
    9-11 July 2014
  • Firstpage
    290
  • Lastpage
    295
  • Abstract
    This paper presents FinCACTI, a cache modeling tool based on CACTI which also supports deeply-scaled FinFET devices as well as more robust SRAM cells. In particular, FinFET devices optimized using advanced device simulators for 7nm process serve as the case study of the paper. Based on this 7nm FinFET process, characteristics of 6T and 8T SRAMs are calculated, and comparison results show that under the same stability requirements the 8T cell has smaller area and leakage power. SRAM and technological parameters of the 7nm FinFET are then incorporated into FinCACTI. According to architecture-level simulations, the 8T SRAM is suggested as the choice of memory cell for 7nm FinFET. Moreover, a 4MB cache in 7nm FinFET compared with 22nm (32nm) CMOS under same access latencies achieves 5x (9x) and 11x (24x) reduction in read energy and area, respectively.
  • Keywords
    CMOS integrated circuits; MOSFET; SRAM chips; cache storage; semiconductor device models; CMOS process; FinCACTI; architectural analysis; architecture-level simulations; cache modeling tool; deeply-scaled FinFET devices; robust SRAM cells; size 7 nm; CMOS integrated circuits; Capacitance; FinFETs; Logic gates; SRAM cells; Semiconductor device modeling; CACTI; Cache Modeling; FinFET devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    978-1-4799-3763-9
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2014.94
  • Filename
    6903378