Title :
IEEE standard 1149.6 implementation for a XAUI-to-serial 10-Gbps transceiver
Author :
Shaikh, Saghir A.
Author_Institution :
Intel Corp., San Diego, CA, USA
Abstract :
The design, implementation and verification of IEEE standard1149.6 IP for a transceiver manufactured with 90 nm technology and using current mode logic (CML) are challenging because (i) CML has high operating frequency, (ii) CML has very low operating voltage range, and (iii) CML is inherently a differential type of circuitry. This work describes how major building blocks of IEEE standard1149.6 IP-such as input test receiver, boundary scan register containing new AC boundary scan cells, output test signal generation circuitry, and modified TAP controller-were implemented and verified. Third-party CAD tools typically used for IEEE standard 1149.1 IP generation were used for this implementation.
Keywords :
IEEE standards; boundary scan testing; circuit CAD; current-mode logic; logic testing; nanoelectronics; transceivers; transport protocols; 10 Gbit/s; 90 nm; AC boundary scan cells; CAD tools; CML; IEEE standard 1149.1 IP generation; IEEE standard 1149.6 IP; TAP controller; XAUI to serial 10-Gbps transceiver; boundary scan register; current mode logic; input test receiver; output test signal generation circuitry; AC generators; Circuit testing; Frequency; Logic circuits; Logic design; Low voltage; Manufacturing; Registers; Transceivers; VHF circuits;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386991