DocumentCode
2439174
Title
Dark currents in double-heterostructure and quantum-well solar cells
Author
Corkish, Richard ; Honsberg, Christiana B.
Author_Institution
Photovoltaics Special Res. Centre, New South Wales Univ., Sydney, NSW, Australia
fYear
1997
fDate
29 Sep-3 Oct 1997
Firstpage
923
Lastpage
926
Abstract
Numerical modelling shows that the separation of the quasi-Fermi potentials in the lower bandgap region of a double-heterostructure may be less than the terminal voltage, resulting in smaller dark currents than would be expected if flat quasi-Fermi levels were assumed. Quasi-Fermi level variations occur as a response to carrier transport limitation by drift and diffusion within the space-charge region or by thermionic emission. This is a possible explanation for the low dark currents which have been measured in quantum-well p-i-n solar cells. This effect, together with evidence that photogenerated carriers can escape from quantum wells with high efficiency, suggests that the inclusion of low-bandgap regions in the depletion regions of solar cells may lead to high efficiency devices
Keywords
Fermi level; energy gap; minority carriers; p-n heterojunctions; semiconductor quantum wells; solar cells; space charge; thermionic emission; carrier transport diffusion; carrier transport drift; carrier transport limitation; dark currents; depletion regions; double-heterostructure; double-heterostructure solar cells; flat quasi-Fermi levels; high efficiency; high efficiency devices; low dark currents; low-bandgap region inclusion; lower bandgap region; numerical modelling; photogenerated carriers; quantum-well p-i-n solar cells; quantum-well solar cells; quasi-Fermi potentials separation; space-charge region; terminal voltage; thermionic emission; Current measurement; Dark current; Numerical models; PIN photodiodes; Photonic band gap; Photovoltaic cells; Quantum well devices; Quantum wells; Thermionic emission; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location
Anaheim, CA
ISSN
0160-8371
Print_ISBN
0-7803-3767-0
Type
conf
DOI
10.1109/PVSC.1997.654238
Filename
654238
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