DocumentCode
2440015
Title
Exception Handling Defects: An Empirical Study
Author
Sawadpong, Puntitra ; Allen, Edward B. ; Williams, Byron J.
Author_Institution
Dept. of Comput. Sci. & Eng., Missisippi State Univ., Starkville, MS, USA
fYear
2012
fDate
25-27 Oct. 2012
Firstpage
90
Lastpage
97
Abstract
Exception handling mechanisms are a feature common in many programming languages. Improper handling of exceptions can cause failures in software systems. This is especially critical for high-assurance systems where software failures may have severe consequences. Understanding the impact of misusing exception handling is important for better utilization of these constructs. This paper presents an exploratory study to determine whether using exception handling is relatively risky by analyzing the defect densities of exception handling code and the overall source code. Also, statistics representing the prevalence of exception handling code are proposed. The study was conducted with six major Eclipse releases. Essential data was collected using custom scripts to extract exception handling information from the source code and exception handling defects information from bug reports. We found that the density of defects that are closely related to exception handling constructs is relatively high compared to the overall defect density. This implies a relationship between the use of exception handling constructs and the risk of defects. Further studies should be conducted to better determine proper ways to implement exception handling and the root causes of exception defects in the software systems.
Keywords
exception handling; software fault tolerance; statistics; Eclipse release; bug reports; defect density analysis; defect risk; exception handling code; exception handling constructs; exception handling defects; exception handling information extraction; exploratory study; high-assurance systems; programming languages; software system failure; source code; statistics; Communities; Density measurement; Equations; Java; Mathematical model; Software systems; Eclipse; defects; empirical study; exception handling; measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Assurance Systems Engineering (HASE), 2012 IEEE 14th International Symposium on
Conference_Location
Omaha, NE
ISSN
1530-2059
Print_ISBN
978-1-4673-4742-6
Type
conf
DOI
10.1109/HASE.2012.24
Filename
6375642
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