• DocumentCode
    2440144
  • Title

    Software fault localization based on program slicing spectrum

  • Author

    Wen, Wanzhi

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
  • fYear
    2012
  • fDate
    2-9 June 2012
  • Firstpage
    1511
  • Lastpage
    1514
  • Abstract
    During software development and maintenance stages, programmers have to frequently debug the software. One of the most difficult and complex tasks in the debugging activity is software fault localization. A commonly-used method to fix software fault is computing suspiciousness of program elements according to failed test executions and passed test executions. However, this technique does not give full consideration to dependences between program elements, thus its capacity for efficient fault localization is limited. Our research intends to introduce program slicing technique and statistical method which extracts dependencies between program elements and refines execution history, then builds program slicing spectra to rank suspicious elements by a statistical metric. We expect that our method will contribute directly to the improvement of the effectiveness and the accuracy of software fault localization and reduce the software development and maintenance effort and cost.
  • Keywords
    program debugging; program slicing; program testing; software maintenance; statistical analysis; execution history refinement; failed test executions; passed test executions; program element dependency extraction; program slicing spectrum; software debugging; software development; software fault localization; software maintenance; statistical method; statistical metric; Debugging; Generators; History; Measurement; Software; Software algorithms; Statistical analysis; fault localization; program slicing spectrum; software debugging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2012 34th International Conference on
  • Conference_Location
    Zurich
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4673-1066-6
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1109/ICSE.2012.6227049
  • Filename
    6227049