Title :
Dynamic analysis of the relay cache-coherence protocol for distributed transactional memory
Author :
Zhang, Bo ; Ravindran, Binoy
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
Transactional memory is an alternative programming model for managing contention in accessing shared in-memory data objects. Distributed transactional memory (TM) promises to alleviate difficulties with lock-based (distributed) synchronization and object performance bottlenecks in distributed systems. In distributed TM systems, both the management and consistency of a distributed transactional object are ensured by a cache-coherence protocol. The Relay protocol is a cache-coherence protocol that operates on a fixed spanning tree. The protocol efficiently reduces the total number of abortions for a given set of transactions. We analyze the Relay protocol for a set of transactions which are dynamically generated in a given time period, and compare the protocol´s time complexity against that of an optimal offline clairvoyant algorithm. We show that Relay is O(log D)-competitive, where D is the diameter of the spanning tree, for a set of transactions that request the same object, given the condition that the maximum local execution time of transactions is sufficiently small.
Keywords :
cache storage; computational complexity; content management; distributed shared memory systems; protocols; synchronisation; O(log D)-competitive; contention management; distributed transactional memory; dynamic analysis; lock-based synchronization; optimal offline clairvoyant algorithm; programming model; relay cache-coherence protocol; shared in-memory data objects; spanning tree; time complexity; Access protocols; Concurrent computing; Content management; Data structures; Dynamic programming; Memory management; Programming profession; Protection; Relays; Safety;
Conference_Titel :
Parallel & Distributed Processing (IPDPS), 2010 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-6442-5
DOI :
10.1109/IPDPS.2010.5470393