DocumentCode
2440562
Title
High current diode and SCR reliability considerations
Author
Comstock, W.R. ; Locher, R.E.
Author_Institution
Semiconductor Products Department, General Electric Company, USA
fYear
1975
fDate
9-11 June 1975
Firstpage
224
Lastpage
233
Abstract
The intent of this paper is to serve as a designer´s guide to enable him to custom design-in the semiconductor reliability required by his power electronic circuit. Normal and special testing procedures to eliminate defective product are considered, along with guide lines to extend the useful life of the product. Successful applications are shown.
Keywords
Junctions; Logic gates; Reliability; Resistance; Semiconductor diodes; Temperature measurement; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1975 IEEE
Conference_Location
Culver City, California, USA
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1975.7085586
Filename
7085586
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