• DocumentCode
    2440680
  • Title

    On the proportioning of chip area for multistage Darlington power transistors

  • Author

    Einthoven, W.G. ; Wheatley, C. F ., Jr.

  • Author_Institution
    RCA Solid State Division, Somerville, N.J., USA
  • fYear
    1975
  • fDate
    9-11 June 1975
  • Firstpage
    282
  • Lastpage
    291
  • Abstract
    A model has been proposed and solved in which all Darlington circuits may be represented to a first order approximation by five constants, one of which may be normalized. Experimental verification has been provided offering excellent agreement with theory. Several orders of magnitude improvement in current handling ability have been shown to exist for multistage Darlington circuits over conventional discrete transistors.
  • Keywords
    Electrical resistance measurement; Integrated circuit modeling; Magneto electrical resistivity imaging technique; Power transistors; Semiconductor device measurement; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1975 IEEE
  • Conference_Location
    Culver City, California, USA
  • ISSN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.1975.7085593
  • Filename
    7085593