DocumentCode
2440680
Title
On the proportioning of chip area for multistage Darlington power transistors
Author
Einthoven, W.G. ; Wheatley, C. F ., Jr.
Author_Institution
RCA Solid State Division, Somerville, N.J., USA
fYear
1975
fDate
9-11 June 1975
Firstpage
282
Lastpage
291
Abstract
A model has been proposed and solved in which all Darlington circuits may be represented to a first order approximation by five constants, one of which may be normalized. Experimental verification has been provided offering excellent agreement with theory. Several orders of magnitude improvement in current handling ability have been shown to exist for multistage Darlington circuits over conventional discrete transistors.
Keywords
Electrical resistance measurement; Integrated circuit modeling; Magneto electrical resistivity imaging technique; Power transistors; Semiconductor device measurement; Transistors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1975 IEEE
Conference_Location
Culver City, California, USA
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1975.7085593
Filename
7085593
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