Title :
ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC ´03 (IEEE Cat. No. 03EX704)
Abstract :
The following topics are dealt with: advanced CMOS and RF devices; optical and radiation detectors; memory devices; oxide parameter extraction; nanocrystalline memories; interconnects and packaging; volatile and non-volatile memories; biosensors, polymer optoelectronics, quantum devices; power devices and applications; advanced CMOS processing; channel engineering; noise characterization and high frequency parameter extraction; simulation and characterization of power and bipolar devices; characterization and parameter extraction; CMOS scaling; process simulation; simulation of transport phenomena in advanced devices; SOI CMOS devices.
Keywords :
CMOS integrated circuits; MOSFET; biosensors; carrier mobility; electronics packaging; heterojunction bipolar transistors; integrated circuit interconnections; nanostructured materials; optoelectronic devices; particle detectors; photodetectors; power electronics; random-access storage; semiconductor device models; semiconductor device noise; semiconductor process modelling; semiconductor storage; silicon-on-insulator; CMOS processing; CMOS scaling; RF devices; SOI CMOS devices; Si-SiO/sub 2/; biosensors; bipolar devices; channel engineering; high frequency parameter extraction; interconnects; memory devices; nanocrystalline memories; noise characterization; nonvolatile memories; optical detectors; oxide parameter extraction; packaging; polymer optoelectronics; power devices; process simulation; quantum devices; radiation detectors; transport phenomena; volatile memories;
Conference_Titel :
European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7999-3
DOI :
10.1109/ESSDERC.2003.1256797
