DocumentCode
2440883
Title
Rap session A - failure modes in power electronics
Author
Mungenast, J. ; Schoop, Ernest ; Fury, Art ; Locher, Ralph ; Jednacz, Tom ; Vaughn, Eldon
Author_Institution
Power Semiconductors, Inc., Devon, Connecticut, USA
fYear
1975
fDate
9-11 June 1975
Firstpage
338
Lastpage
341
Abstract
In IEEE and PESC papers given in 1973 and 1974 the subject of Power Electronic reliability was explored. Past and potential problem areas were explored, and a survey of international users and manufacturers pointed out areas for further study.
Keywords
Fuses; Integrated circuit reliability; Integrated circuits; Testing; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1975 IEEE
Conference_Location
Culver City, California, USA
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1975.7085602
Filename
7085602
Link To Document