DocumentCode
2440911
Title
Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
fYear
1998
fDate
6-8 Oct. 1998
Abstract
Presents the front cover and table of contents to the Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (IEEE Cat. No.98TH8347).
Keywords
circuit simulation; electrostatic discharge; integrated circuit technology; magnetic heads; magnetoresistive devices; protection; EOS; ESD; MR heads; circuit simulation; factory issues; materials; on-chip protection; semiconductor processes; system level issues;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location
Reno, NV, USA
Print_ISBN
1-878303-91-0
Type
conf
DOI
10.1109/EOSESD.1998.737011
Filename
737011
Link To Document