Title :
Precise measurement of the accuracy of 24 bit ADC by AC Josephson effect
Author :
Yoshida, H. ; Kozakai, T. ; Yada, E. ; Murayama, Y.
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
Abstract :
This paper reports precise measurement of the offset error voltage and non-linearity error voltage of 24 bit analog to digital converter (ADC) from -10 V to +10 V on the basis of 10-V Josephson junction array voltage standard system (10-V JJAVS). Characteristics of the ADC have improved with correction of detected localized raggedness of those errors.
Keywords :
Josephson effect; analogue-digital conversion; characteristics measurement; integrated circuit measurement; measurement standards; superconducting junction devices; voltage measurement; -10 to 10 V; 24 bit; AC Josephson effect; ADC; JJAVS; Josephson junction array; analog to digital converter; localized raggedness; nonlinearity error voltage; offset error voltage; voltage standard system; Electrical resistance measurement; Error correction; Josephson effect; Laboratories; Linearity; Millimeter wave measurements; Programmable control; Pulse measurements; Pulse width modulation; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547043
