Title :
Metrology and methodology of system level ESD testing
Author :
Lin, D. ; Pommerenke, D. ; Barth, J. ; Henry, L.G. ; Hyatt, H. ; Hopkins, M. ; Senko, G. ; Smith, D.
Author_Institution :
Eng. Res. Center, Lucent Technol., Princeton, NJ, USA
Abstract :
Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
Keywords :
calibration; electric current measurement; electromagnetic waves; electronic equipment testing; electrostatic discharge; standards; ESD current measurement; calibration methodology; metrology; output current; radiated fields; simulator calibration methodology; simulator specifications; system level ESD testing; system level ESD testing methodology; system level ESD testing metrology; system level ESD tests; test reproducibility; Calibration; Current measurement; Electronic equipment testing; Electrostatic discharge; IEC standards; Metrology; Physics; Reproducibility of results; Round robin; System testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
DOI :
10.1109/EOSESD.1998.737019
