• DocumentCode
    2441087
  • Title

    Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors

  • Author

    Ning, Zhenqiu ; De Schepper, Luc ; Gillon, Renaud ; Tack, Marnix

  • Author_Institution
    AMI Semicond. Belgium bvba, Oudenaarde, Belgium
  • fYear
    2003
  • fDate
    16-18 Sept. 2003
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    This paper presents a floating gate AC nulling technique for the characterisation and modelling of the matching properties of MOS capacitors. The technique is insensitive to the parasitic capacitor and charge accumulation on the floating gate, due to AC nulling. It is accurate, robust and easily used.
  • Keywords
    MOS capacitors; capacitance measurement; MOS capacitor matching properties characterisation; floating gate AC nulling technique; floating gate charge accumulation; floating gate parasitic capacitor; Ambient intelligence; Circuit testing; Clocks; MOS capacitors; MOS devices; Matched filters; Robustness; Semiconductor device measurement; Switched capacitor circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on
  • Conference_Location
    Estoril, Portugal
  • Print_ISBN
    0-7803-7999-3
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2003.1256815
  • Filename
    1256815
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2441087