DocumentCode :
2441516
Title :
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
Author :
Devos, Nicolas ; Ponsard, Christophe ; Deprez, Jean-Christophe ; Bauvin, Renaud ; Moriau, Benedicte ; Anckaerts, Guy
Author_Institution :
Software & Syst. Eng., CETIC Res. Center, Charleroi, Belgium
fYear :
2012
fDate :
2-9 June 2012
Firstpage :
1123
Lastpage :
1132
Abstract :
While testing is heavily used and largely automated in software development projects, the reuse of test practices across similar projects in a given domain is seldom systematized and supported by adequate methods and tools. This paper presents a practical approach that emerged from a concrete industrial case in the smart card domain at STMicroelectronics Belgium in order to better address this kind of challenge. The central concept is a test knowledge repository organized as a collection of specific patterns named QPatterns. A systematic process was followed, first to gather, structure and abstract the test practices, then to produce and validate an initial repository, and finally to make it evolve later on Testers can then rely on this repository to produce high quality test plans identifying all the functional and nonfunctional aspects that have to be addressed, as well as the concrete tests that have to be developed within the context of a new project. A tool support was also developed and integrated in a traceable way into the existing industrial test environment. The approach was validated and is currently under deployment at STMicroelectronics Belgium.
Keywords :
program testing; project management; smart cards; software management; STMicroelectronics Belgium; domain specific test knowledge; industrial case; industrial test environment; smart card domain; software development projects; Concrete; Libraries; Security; Smart cards; Software; Testing; generation; patterns; smartcard; test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering (ICSE), 2012 34th International Conference on
Conference_Location :
Zurich
ISSN :
0270-5257
Print_ISBN :
978-1-4673-1066-6
Electronic_ISBN :
0270-5257
Type :
conf
DOI :
10.1109/ICSE.2012.6227107
Filename :
6227107
Link To Document :
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