DocumentCode :
2441803
Title :
ESD prevention on an unshunted MR head
Author :
Zhu, Li-Yan
Author_Institution :
Headway Technol. Inc., Milpitas, CA, USA
fYear :
1998
fDate :
6-8 Oct. 1998
Firstpage :
351
Lastpage :
359
Abstract :
A magneto-resistive (MR) head is easily damaged by a transient current due to electrostatic discharge (ESD). Often the current is introduced through unshunted leads. The damage can be prevented by two practical methods. First, the potential of a MR head and any bare conductor can be equalized through a large resistor before direct contact. Second, the MR head potential can be reduced capacitively, i.e. through a virtual ground. Several examples are described.
Keywords :
electrostatic discharge; magnetic heads; magnetoresistive devices; protection; reliability; static electrification; transients; ESD prevention; MR head potential; MR head/bare conductor potential equalization; capacitive MR head potential reduction; damage prevention; direct contact; electrostatic discharge; magneto-resistive head; resistor equalization; transient current damage; unshunted MR head; unshunted leads; virtual ground; Assembly; Conductors; Contact resistance; Electrostatic discharge; Insulation; Lead; Magnetic heads; Magnetic susceptibility; Resistors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
Type :
conf
DOI :
10.1109/EOSESD.1998.737056
Filename :
737056
Link To Document :
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