• DocumentCode
    2441803
  • Title

    ESD prevention on an unshunted MR head

  • Author

    Zhu, Li-Yan

  • Author_Institution
    Headway Technol. Inc., Milpitas, CA, USA
  • fYear
    1998
  • fDate
    6-8 Oct. 1998
  • Firstpage
    351
  • Lastpage
    359
  • Abstract
    A magneto-resistive (MR) head is easily damaged by a transient current due to electrostatic discharge (ESD). Often the current is introduced through unshunted leads. The damage can be prevented by two practical methods. First, the potential of a MR head and any bare conductor can be equalized through a large resistor before direct contact. Second, the MR head potential can be reduced capacitively, i.e. through a virtual ground. Several examples are described.
  • Keywords
    electrostatic discharge; magnetic heads; magnetoresistive devices; protection; reliability; static electrification; transients; ESD prevention; MR head potential; MR head/bare conductor potential equalization; capacitive MR head potential reduction; damage prevention; direct contact; electrostatic discharge; magneto-resistive head; resistor equalization; transient current damage; unshunted MR head; unshunted leads; virtual ground; Assembly; Conductors; Contact resistance; Electrostatic discharge; Insulation; Lead; Magnetic heads; Magnetic susceptibility; Resistors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
  • Conference_Location
    Reno, NV, USA
  • Print_ISBN
    1-878303-91-0
  • Type

    conf

  • DOI
    10.1109/EOSESD.1998.737056
  • Filename
    737056