Impact of gate current noise on drain current noise in 90 nm CMOS technology

Gate and drain current noises on a 90 nm CMOS technology are investigated. Gate current noise shows 1/f and white noise. White noise is very close to shot noise, and we have a quadratic variation of 1/f noise with gate current. Coherence measurements show that the increase of drain noise at high gate biases can be attributed to tunneling effects.