• DocumentCode
    2442089
  • Title

    The influence of parasitic resistances on the f/sub T/-optimisation of high-speed SiGe-HBTs

  • Author

    Agarwal, P. ; Huizing, H.G.A. ; Magnée, P. H C

  • Author_Institution
    Philips Res. Leuven, Belgium
  • fYear
    2003
  • fDate
    16-18 Sept. 2003
  • Firstpage
    291
  • Lastpage
    294
  • Abstract
    We study the influence of parasitic series resistances on the cut-off frequency of high-speed SiGe hetero-junction bipolar transistors. Due to coupling of the parasitic resistances with the internal collector-base capacitance, significant extra delay time is introduced. This extra delay will cause saturation, or even a decrease of f/sub T/ at higher collector doping levels. In addition, we study the optimisation of an n-cap emitter profile, which is only possible when the collector delay is reduced to a minimum, and the series resistances are properly included.
  • Keywords
    Ge-Si alloys; doping profiles; heterojunction bipolar transistors; millimetre wave bipolar transistors; optimisation; semiconductor materials; 150 GHz; SiGe; collector delay; collector doping levels; cut-off frequency optimisation; doping profile; hetero-junction bipolar transistors; high-speed SiGe-HBT; internal collector-base capacitance; n-cap emitter profile; parasitic series resistances; Bipolar transistors; Cutoff frequency; Delay effects; Doping profiles; Epitaxial growth; Germanium silicon alloys; Medical simulation; Parasitic capacitance; Printing; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on
  • Conference_Location
    Estoril, Portugal
  • Print_ISBN
    0-7803-7999-3
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2003.1256871
  • Filename
    1256871