DocumentCode :
2442089
Title :
The influence of parasitic resistances on the f/sub T/-optimisation of high-speed SiGe-HBTs
Author :
Agarwal, P. ; Huizing, H.G.A. ; Magnée, P. H C
Author_Institution :
Philips Res. Leuven, Belgium
fYear :
2003
fDate :
16-18 Sept. 2003
Firstpage :
291
Lastpage :
294
Abstract :
We study the influence of parasitic series resistances on the cut-off frequency of high-speed SiGe hetero-junction bipolar transistors. Due to coupling of the parasitic resistances with the internal collector-base capacitance, significant extra delay time is introduced. This extra delay will cause saturation, or even a decrease of f/sub T/ at higher collector doping levels. In addition, we study the optimisation of an n-cap emitter profile, which is only possible when the collector delay is reduced to a minimum, and the series resistances are properly included.
Keywords :
Ge-Si alloys; doping profiles; heterojunction bipolar transistors; millimetre wave bipolar transistors; optimisation; semiconductor materials; 150 GHz; SiGe; collector delay; collector doping levels; cut-off frequency optimisation; doping profile; hetero-junction bipolar transistors; high-speed SiGe-HBT; internal collector-base capacitance; n-cap emitter profile; parasitic series resistances; Bipolar transistors; Cutoff frequency; Delay effects; Doping profiles; Epitaxial growth; Germanium silicon alloys; Medical simulation; Parasitic capacitance; Printing; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7999-3
Type :
conf
DOI :
10.1109/ESSDERC.2003.1256871
Filename :
1256871
Link To Document :
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