• DocumentCode
    2442110
  • Title

    Comparison of 10 V calibrations between KRISS and ETL

  • Author

    Kyu-Tae Kim ; Sakamoto, Y. ; Sakuraba, T.

  • Author_Institution
    Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    236
  • Lastpage
    237
  • Abstract
    The results of an intercomparison of 10 V dc voltage standard calibrations between KRISS (Korea) and ETL (Japan) conducted from September to October in 1995 are described. A commercial Zener voltage standard (Fluke 732 B) owned by KRISS was hand-carried for the comparison. A preliminary analysis of the result is strongly implying the two 10 V calibration systems, both of which are based on 10:1 divider and l-V Josephson array are in good agreement within an uncertainty less than 0.05 ppm.
  • Keywords
    Josephson effect; calibration; measurement errors; measurement standards; superconducting junction devices; voltage measurement; 10 V; DC voltage standard; ETL; KRISS; Zener voltage standard; calibrations; l-V Josephson array; uncertainty; Batteries; Calibration; Circuits; Cities and towns; Laboratories; Linear regression; Resistors; Uncertainty; Voltage; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1996 Conference on
  • Conference_Location
    Braunschweig, Germany
  • Print_ISBN
    0-7803-3376-4
  • Type

    conf

  • DOI
    10.1109/CPEM.1996.547048
  • Filename
    547048