Title : 
Comparison of 10 V calibrations between KRISS and ETL
         
        
            Author : 
Kyu-Tae Kim ; Sakamoto, Y. ; Sakuraba, T.
         
        
            Author_Institution : 
Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
         
        
        
        
        
        
            Abstract : 
The results of an intercomparison of 10 V dc voltage standard calibrations between KRISS (Korea) and ETL (Japan) conducted from September to October in 1995 are described. A commercial Zener voltage standard (Fluke 732 B) owned by KRISS was hand-carried for the comparison. A preliminary analysis of the result is strongly implying the two 10 V calibration systems, both of which are based on 10:1 divider and l-V Josephson array are in good agreement within an uncertainty less than 0.05 ppm.
         
        
            Keywords : 
Josephson effect; calibration; measurement errors; measurement standards; superconducting junction devices; voltage measurement; 10 V; DC voltage standard; ETL; KRISS; Zener voltage standard; calibrations; l-V Josephson array; uncertainty; Batteries; Calibration; Circuits; Cities and towns; Laboratories; Linear regression; Resistors; Uncertainty; Voltage; Wiring;
         
        
        
        
            Conference_Titel : 
Precision Electromagnetic Measurements Digest, 1996 Conference on
         
        
            Conference_Location : 
Braunschweig, Germany
         
        
            Print_ISBN : 
0-7803-3376-4
         
        
        
            DOI : 
10.1109/CPEM.1996.547048