Title :
Charge Distribution and Memory Effect of Piezoelectric Gates
Author :
Motamedi, M.E. ; Cserhati, A.F. ; Staples, E.J. ; Lim, T.C.
Keywords :
Piezoelectric devices; Piezoelectric films; Semiconductor films; Signal processing; Sputtering; Substrates; Surface acoustic waves; Temperature; X-ray diffraction; Zinc oxide;
Conference_Titel :
1980 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1980.197440
