DocumentCode :
2442397
Title :
Empirical mode decomposition as a tool for DNA sequence analysis from terahertz spectroscopy measurements
Author :
Weng, Binwei ; Xuan, Guangchi ; Kolodzey, James ; Barner, Kenneth E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE
fYear :
2006
fDate :
28-30 May 2006
Firstpage :
63
Lastpage :
64
Abstract :
DNA sequence analysis has been widely studied by gene-expression microarray techniques. Few results, however, have been provided by Terahertz spectroscopy which reveals the absorbtion or reflectance percentage from different DNA sequences. Previous Terahertz methods have lacked a quantitative analysis of the spectroscopy features, and no definitive conclusion regarding the data can be easily drawn. In this paper, we use a signal processing approach which gives a quantitative interpretation of the DNA spectroscopy. Due to the presence of physical noise, the data can be contaminated by both random fluctuations and impulsive noise. A new signal processing tool called empirical mode decomposition (EMD) is employed to remove the noise and extract the trend of the signal. The data is subsequently partitioned by clustering methods. Experimental results of Terahertz spectroscopy of several different DNA samples show that the EMD aids the clustering process and yields clustering of higher validity than that obtained from the raw data.
Keywords :
DNA; biology computing; molecular biophysics; molecular configurations; signal denoising; submillimetre wave spectra; DNA sequence analysis; Terahertz spectroscopy measurements; clustering methods; empirical mode decomposition; gene-expression microarray techniques; impulsive noise; noise removal; random fluctuations; signal processing; Clustering methods; DNA; Data mining; Fluctuations; Pollution measurement; Reflectivity; Sequences; Signal processing; Spectroscopy; Submillimeter wave measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Genomic Signal Processing and Statistics, 2006. GENSIPS '06. IEEE International Workshop on
Conference_Location :
College Station, TX
Print_ISBN :
1-4244-0384-7
Electronic_ISBN :
1-4244-0385-5
Type :
conf
DOI :
10.1109/GENSIPS.2006.353157
Filename :
4161778
Link To Document :
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