• DocumentCode
    2442468
  • Title

    Author index

  • fYear
    2000
  • fDate
    22-24 May 2000
  • Firstpage
    172
  • Lastpage
    172
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Process-Induced Damage, 2000 5th International Symposium on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-9651577-4-1
  • Type

    conf

  • DOI
    10.1109/PPID.2000.870672
  • Filename
    870672