Title :
Obstacle detection by recognizing binary expansion patterns
Author :
Baram, Yoram ; Barniv, Yair
Author_Institution :
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
fDate :
27 Jun- 2 Jul 1994
Abstract :
This paper describes a technique for obstacle detection, based on the expansion of the image-plane projection of a textured object, as its distance from the sensor decreases. Information is conveyed by vectors whose components represent first-order temporal and spatial derivatives of the image intensity, which are related to the time to collision through the local divergence. Such vectors may be characterized as patterns corresponding to “safe” or “dangerous” situations. The authors show that the essential information is conveyed by single-bit vector components, representing the signs of the relevant derivatives. The authors use two previously developed, high capacity classifiers, employing neural learning techniques, to recognize the imminence of collision from such patterns
Keywords :
computer vision; image sequences; learning (artificial intelligence); neural nets; binary expansion patterns; high capacity classifiers; image intensity; image-plane projection; local divergence; neural learning techniques; obstacle detection; single-bit vector components; textured object; time to collision; Image motion analysis; Image sensors; Layout; NASA; Optical imaging; Optical sensors; Pattern recognition; Robot sensing systems; Sensor phenomena and characterization; Vectors;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374884