DocumentCode :
2442672
Title :
Thermal-Wave-Microscopy: A New Application of the Scanning Electron Microscope
Author :
Brandis, E.K.
fYear :
1980
fDate :
1980
Firstpage :
608
Lastpage :
609
Keywords :
Amplifiers; Electron beams; Frequency modulation; Optical microscopy; Optical modulation; Photothermal effects; Scanning electron microscopy; Scattering; Signal generators; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197470
Filename :
1534410
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2442672
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