DocumentCode
2442816
Title
IN-SITU PTR and PTP Measurements of a Magnetic Head
Author
Yufeng Li ; Geng Wang
Author_Institution
Samsung Information Systems America
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
87
Lastpage
87
Keywords
Contamination; Disk drives; Ellipsometry; Lubricants; Magnetic force microscopy; Magnetic heads; Optical films; Pollution measurement; Silicon; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.737114
Filename
737114
Link To Document