Title :
ADC non-linearity low-cost test through a simplified Double-Histogram method
Author :
Jalón, M.A. ; Peralías, E.
Author_Institution :
Inst. de Microelectron. de Sevilla (IMSE), Centro Nac. de Microelectron. (CNM-CSIC), Spain
Abstract :
This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.
Keywords :
analogue-digital conversion; waveform generators; ADC nonlinearity; double histogram method; low cost test; nonlinearity characteristics; test signal waveform; test sources; Costs; Histograms; Linearity; Pipelines; Signal generators; Signal processing; Signal resolution; Synchronous digital hierarchy; Testing; Transfer functions;
Conference_Titel :
Mixed-Signals, Sensors, and Systems Test Workshop, 2009. IMS3TW '09. IEEE 15th International
Conference_Location :
Scottsdale, AZ
Print_ISBN :
978-1-4244-4618-6
Electronic_ISBN :
978-1-4244-4617-9
DOI :
10.1109/IMS3TW.2009.5158686
