DocumentCode :
2443405
Title :
Stress Induced Frequency Shifts in Thickness-Mode Quartz Resonators
Author :
Sinha, B.K.
fYear :
1980
fDate :
1980
Firstpage :
813
Lastpage :
818
Keywords :
Anisotropic magnetoresistance; Environmental factors; Equations; Geometry; Navigation; Resonant frequency; Stress; Temperature measurement; Temperature sensors; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197511
Filename :
1534451
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2443405
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