DocumentCode :
2443573
Title :
Uniform remanent state noise and its relation to microstructure
Author :
Bissell, P.R. ; Araghi, M.S. ; Clarke, M.D. ; Chantrell, R.W.
Author_Institution :
Lancashire Polytechnic
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
244
Lastpage :
244
Keywords :
Electromagnetic measurements; Magnetic field measurement; Magnetic heads; Magnetic noise; Microstructure; Noise figure; Noise measurement; Remanence; Saturation magnetization; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696427
Filename :
696427
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2443573
بازگشت