• DocumentCode
    2443617
  • Title

    In-situ TEM investigation of stepping motion of telescoping carbon nanotube

  • Author

    Ode, Yasuhito ; Nakajima, Masahiro ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2010
  • fDate
    21-22 Dec. 2010
  • Firstpage
    366
  • Lastpage
    271
  • Abstract
    We report the stepping reinsertion motion of inner core of telescoping nanotube by In-situ transmission electron microscope (TEM) nanomanipulation. The telescoping nanotubes are fabricated through electrical breakdown at the tip of nanotubes using contact resistance. The smooth reinsertion motion of the core was also observed at long telescoping nanotube. The motion is considered to be caused by the curvature of the outer shells and the gap between the axes of the nanotube and pushing force. As next generational nanoelectro-mechanical systems (NEMS), the stepping motion has a possibility to use for the stepping motion of nanoactuator using telescoping nanotubes.
  • Keywords
    carbon nanotubes; electromechanical actuators; nanofabrication; transmission electron microscopy; In-situ TEM Investigation; NEMS; contact resistance; electrical breakdown; in-situ transmission electron microscope nanomanipulation; nanoactuator; nanoelectromechanical systems; nanofabrication; stepping motion; telescoping carbon nanotubes; Contamination; Electrodes; Manipulators; Microscopy; Probes; Surface treatment; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Integration (SII), 2010 IEEE/SICE International Symposium on
  • Conference_Location
    Sendai
  • Print_ISBN
    978-1-4244-9316-6
  • Type

    conf

  • DOI
    10.1109/SII.2010.5708336
  • Filename
    5708336