DocumentCode
2443617
Title
In-situ TEM investigation of stepping motion of telescoping carbon nanotube
Author
Ode, Yasuhito ; Nakajima, Masahiro ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear
2010
fDate
21-22 Dec. 2010
Firstpage
366
Lastpage
271
Abstract
We report the stepping reinsertion motion of inner core of telescoping nanotube by In-situ transmission electron microscope (TEM) nanomanipulation. The telescoping nanotubes are fabricated through electrical breakdown at the tip of nanotubes using contact resistance. The smooth reinsertion motion of the core was also observed at long telescoping nanotube. The motion is considered to be caused by the curvature of the outer shells and the gap between the axes of the nanotube and pushing force. As next generational nanoelectro-mechanical systems (NEMS), the stepping motion has a possibility to use for the stepping motion of nanoactuator using telescoping nanotubes.
Keywords
carbon nanotubes; electromechanical actuators; nanofabrication; transmission electron microscopy; In-situ TEM Investigation; NEMS; contact resistance; electrical breakdown; in-situ transmission electron microscope nanomanipulation; nanoactuator; nanoelectromechanical systems; nanofabrication; stepping motion; telescoping carbon nanotubes; Contamination; Electrodes; Manipulators; Microscopy; Probes; Surface treatment; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
System Integration (SII), 2010 IEEE/SICE International Symposium on
Conference_Location
Sendai
Print_ISBN
978-1-4244-9316-6
Type
conf
DOI
10.1109/SII.2010.5708336
Filename
5708336
Link To Document